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By apacciooutlook | Tuesday, February 09, 2016
FREMONT, CA: Optimal +, a Big Data analytics provider for the semi-conductor industry, collaborates with NI –a provider of platform based test systems– to test and run the entire suite of solutions from Optimal+, and ensure that it is supported by NI’s Semiconductor Test System (STS) through Optimal+ Proxy.
The Internet of Things (IoT) has great potential to drive growth of the semi-conductor industry and semiconductor companies are optimizing their efficiency and productivity. Optimal +will be leveraging their real-time solutions on STS to boost efficiencies in the manufacturing sector.
This ability to analyze data on the open, modular architecture of the STS will reduce hardware test costs, improve throughput and increase overall quality. Optimal +’s existing solutions for IDMs, OSATs, and fabless companies are enabling them to maximize their manufacturing supply chain
"Semiconductor companies are striving to increase productivity, thus the focus on reducing test time and increasing throughput. This has increased the adoption of both the NI Semiconductor Test System (STS) and the Big Data Analytics solutions from Optimal+ in the semiconductor manufacturing space over the past few years,” says Jessy Cavazos, Industry Director of Test & Measurement at Frost & Sullivan. “The STS’s open and modular software and hardware facilitates the integration of Optimal+ software adding significant value to customers. By collaborating together, NI and Optimal+ are enabling semiconductor customers to take production, productivity, and product quality to new heights, a sector in which single digit improvements can save millions of dollars."