BISTel, a leading provider of intelligent, real-time data management, advanced analytics and predictive solutions company announced the launch of Dynamic Fault Detection (DFD). It is the first adaptive A.I based application of its kind to enable the smartly connected factory. The new solution offers customers full sensor trace data analysis to uncover faults and improve engineering productivity, tool productivity and yield exponentially.

Today, customers use Fault Detection and Classification (FDC) system to detect faults. The summary data analysis from the sensors allows small changes in the sensor go undetected, resulting in a negative impact on the yield. The Dynamic Fault Detection is equipped with full trace analysis and establishes a trace references dynamically and does not depend on the traditional control limiting methods used by FDC. DFD uses smarter algorithms which better differentiates between real alarms and false alarms, resulting in complete elimination of manual modeling and 10 times fewer alarms than the FDC system.

DFD is the first of its kind online system with a wealth of information that assists manufacturers to identify potential yield issues, spikes, including ramp rate changes, glitches, drift and shift. Instead of static control limits, the system has real-time fault detection with dynamic references. The system cuts risk by protecting against yield influencing events. Real-time tracking enhance quality and yield and intelligent alarms reduce false alarms by 10 times. The online system provides smart and quick, detection and evaluation of yield impacting events. The advanced sensor behavior analysis enables best system drift detection.

W.K. Choi, Founder and CEO, BISTel said, "DFD is the first of several intelligent manufacturing applications with new machine learning that helps our customers to start to realize the full potential of A.I. for smart manufacturing. DFD allows customers to rapidly and accurately detect faults and aids our customers create an early identification of yield-related problems so that they can quickly execute the fastest possible response to solving these issues.”